Use the Select Library Test screen to run the Installation Verification Test
(IVT) following a library service action to determine if the library is ready
for production use. Examples of such library service actions include installing
a new library and replacing a customer replaceable unit (CRU).
NOTE: IVT is optimized for library firmware versions 520G and above and libraries built after July 1, 2008 (serial numbers with last four digits ivt.1
and above).
If your library was built on or before July 1, 2008, and you are running firmware version 520G or above, you will not be able to run the IVT test, even though the selection is available.
If your library was built on or before July 1, 2008, and you are running firmware version 500G or below, you can run the test, but it is not recommended because it may produce erroneous results.
The IVT is divided into five subtests. You can run only certain subtests depending
on the amount of time available and your area of interest. The full IVT can
take up to five and one-half hours to complete for large configurations. The
five subtests are as follows:
- Robot test - Evaluates the basic functionality of the library robotics
assembly, including the picker assembly and the Y-carriage assembly, the
barcode scanner and the calibration sensors. Time required to complete the
Robot test is approximately five minutes.
- Frame test - Assesses the module configuration and alignment. Time required
to complete the Frame test is approximately three minutes per module.
- i/e.1 Station test - Assesses the configuration and functionality
of each i/e.1 station. Time required to compete the i/e.1
Station test is approximately three minutes per i/e.1 station.
- Drives test - Performs functional tests on the library tape drives. Time
required to complete the Drives test is approximately 15 minutes per drive.
- Tour test - Moves a scratch data cartridge through all storage slots in
the extreme library locations. It also scans the top and bottom most slots
in the library and performs get/put operations using non-scratch data cartridges.
Time required to complete the Tour is approximately five minutes per module.
All IVT subtests are preselected by default. Clear the check box next to a
subtest name to exclude that test from an IVT run.
The Robot, Drives and Tour subtests each require that you to provide a scratch
data cartridge before the test can begin. If you select one of these subtests,
you will be prompted to place a scratch data cartridge into the top i/e.1
station slot. When you close the i/e.1 station, the Assign i/e.1
screen appears if the Manual Cartridge Assignment setting is enabled on the
operator panel System Settings screen (Tools > System Settings). Assign the
new scratch data cartridge to the System partition, and then select Apply.
The Drives subtest only tests those tape drives that have the same media type as the scratch data cartridge. For example, if the scratch data cartridge is LTO-3, then all tape drives that are not LTO-3 will be skipped in Drives test. If the tape drives in the library have different media types, you must run the Drives test multiple times with a different scratch data cartridge for each tape drive media type.
Do the following:
- Select the IVT subtests you want to run.
- Select Apply.
Note: At any time, select Cancel to exit the Select Library Test screen.